SDV3: Correlative Microscopy

SDV3: Correlative Microscopy

Jacomine Krijnse-Locker (Pasteur, Paris), Jean Michel (LRN, Reims)

Keywords: CLEM, AFM, EDX, EELS, X-ray

Abstract

Cryo-electron microscopes of the latest generation are now able to resolve structures at near-atomic level rekindling a big interest in EM. However, at high resolution the overview is lost; rare or dynamic events detected by light microscopy are difficult or impossible capture by EM, hence the need to correlate a light microscopy signal with high-resolution detail. Correlated light- and electron microscopy (CLEM) defines a range of methodologies because the combination of light- and EM-imaging techniques depends on the questions asked. Further challenges of CLEM are the imaging of regions of interest with high precision, and of a significant number of events to allow for quantification. It may require workflows where the EM is automatically guided to positions of interest. CLEM and cryo-CLEM finds applications in a broad range of questions in biological sciences; the way pathogens interact with their host at the cellular, as well as at the tissue, level, to give one example. On the highest possible resolution scale CLEM approaches find application in resolving protein complexes in situ, within their natural context rather than as purified complex.  On a larger scale, fluorescence imaging may be use to target nanoanalysis (EDXS, EELS) within tagged domains (rich chromatin areas for instance) or to discriminate cells or tissues areas as a function of their functional state (stages of apoptosis for instance).   Finally, correlative microscopy is not limited to light and electron microscopies and this symposium will also welcome contributions from other imaging modalities like AFM, X-ray…

Programme and communication abstracts

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